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Keithley’s S530 Series Parametric Test Systems with KTE 7 Software
offer high-speed, fully flexible configurations that can grow as new applications emerge and requirements change. The S530 accommodates testing up to 200 V, and the S530-HV enables testing up to 1100 V on any pin, boosting throughput up to 50% over competitive solutions. New for KTE 7 is an optional system Testhead that enables direct docking to a prober and legacy probe card re-use, system-level ISO-17025 calibration-to-the-pin that supports the requirements of automotive standard IATF-16949, and the easiest, smoothest migration path from legacy S600 and S400 systems with full data correlation and speed improvements.
